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Scanning Probe Microscopes

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Park Systems Corp. - Suwon, South Korea

Glossary

scanning probe microscope See atomic force microscope; magnetic force microscope; near-field scanning optical microscope; scanning tunneling microscope.
atomic force microscope An atomic force microscope (AFM) is a high-resolution imaging and measurement instrument used in nanotechnology, materials science, and biology. It is a type of scanning probe microscope that operates by scanning a sharp tip (usually a few...
magnetic force microscope A variation of the atomic force microscope that operates by scanning a tiny ferromagnetic probe (or a magnetized tip) over a magnetic sample, and detecting the extremely small forces exerted on the probe by the sample's stray magnetic fields. The...
near-field scanning optical microscope A scanning probe microscope that analyzes the surface of a specimen by recording the intensity of light as it is focused through a pipette and raster scanned across the specimen at a distance less than a wavelength. The resolution and high contrast...

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